We are providing an unedited version of this manuscript to give early access to its findings. Before final publication, the manuscript will undergo further editing. Please note there may be errors ...
When we met Sterling Anderson in 2024, he was the chief product officer of Aurora, the self-driving startup he cofounded in 2016 after several years at Tesla. Just over a year ago, though, Anderson ...
ML.NET is a cross-platform open-source machine learning (ML) framework for .NET. ML.NET allows developers to easily build, train, deploy, and consume custom models in their .NET applications without ...
Microsoft released an emergency patch for its ASP.NET Core to fix a high-severity vulnerability that allows unauthenticated attackers to gain SYSTEM privileges on devices that use the Web development ...
Abstract: Industrial defect detection is crucial in the field of industrial production. Recently, industrial defect detection methods based deep learning have been proven to effectively address most ...
When Jared Hewitt’s co-worker claimed last winter that Hewitt used AI to write an incident report, she did it publicly. “And I work at a day care, so she was berating me in front of children,” he says ...
Infected bone defects arise in conditions such as osteomyelitis and post-traumatic bone infections, where microbial persistence and immune imbalance prevent effective healing. Standard treatments rely ...
Congenital heart defects (CHDs) are among the most common birth defects, affecting nearly 1 in 100 babies born in the U.S. Yet despite advances in prenatal imaging, CHD remains one of the most ...
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Microsoft has released .NET 11 Preview 1, a planned update to the cross-platform software development platform that features JIT performance improvements, faster compression, CoreCLR support ...
Effectively detecting subtle surface defects in strip steel is vital for industrial quality assurance; however, most existing approaches fail to strike an optimal balance between accuracy and ...
Photo-induced force microscopy (PiFM) is a sophisticated nanoscale characterization approach that combines the elevated spatial resolution of atomic force microscopy (AFM) with infrared (IR) ...