The process of printing defect detection usually suffers from challenges such as inaccurate defect extraction and localization, caused by uneven illumination and complex textures. Moreover, image ...

We are providing an unedited version of this manuscript to give early access to its findings. Before final publication, the manuscript will undergo further editing. Please note there may be errors ...

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...

There's no more important topic than machine learning in the developer space right now as advanced AI constructs like ChatGPT and Microsoft's "Copilot" assistants are transforming the industry. With ...